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Effects of interfacial roughness on the magnetoresistance of Co/Cu multilayers

Identifieur interne : 000640 ( Main/Exploration ); précédent : 000639; suivant : 000641

Effects of interfacial roughness on the magnetoresistance of Co/Cu multilayers

Auteurs : F. Trigui [Tunisie] ; B. Elsafi [Tunisie] ; Z. Fakhfakh [Tunisie] ; P. Beauvillain [France]

Source :

RBID : Pascal:10-0168545

Descripteurs français

English descriptors

Abstract

Using a semi-classical approach, Hood, Falicov and Penn have studied the effects of interfacial roughness on the magnetoresistance (MR) of iron based trilayers (Fe/Cr/Fe and Fe/Cu/Fe). We extend their theory to magnetic metallic multilayers composed of N bilayers ferromagnetic-normal metal. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The averaged effects due to impurities, interdiffusion, band structure, etc. are included in a simple way using two phenomenological parameters S↑ and S↓ for two directions of spin. MR variation with S↑, S↓ and relaxation time is reported. We analyse also recent experimental data giving the influence of number of bilayers on the MR of Co/Cu multilayers for different temperatures.


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